Publications: Process Variations

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2009

There are 3 entries in this category.

Title - Conference/Journal/BookAuthorsDate
LER-induced limitations to VDD scalability of FinFET-based SRAMs with different design options.E. Baravelli, L. De Marchi, N. Speciale2009
- Proc. ESSDERC

Correlation of fin shape fluctuations to FinFET electrical variability and noise margins of 6-T SRAM.E. Baravelli, L. De Marchi, M. Jurczak, N. Speciale2009
- Proc. ULIS

Fin-shape fluctuations in FinFET: Correlation to electrical variability and impact on 6-T SRAM noise margins.E. Baravelli, L. De Marchi, N. Speciale2009
- Solid-State Electronics


All Years | 2009 | 2008 | 2007 | 2006 | Earlier


OwnBiblio 1.4 by P.A.Henning, C.Kolodziej, G.Langenbacher,B.Boss, J.Finn and P.Hübner


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