Publications: Process Variations

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2007

There are 2 entries in this category.

Title - Conference/Journal/BookAuthorsDate
Impact of LER and Random Dopant Fluctuations on FinFET Matching Performance.E. Baravelli, M. Jurczak, N. Speciale, K. De Meyer, A. Dixit2007
- Silicon Nanoelectronics Workshop

Impact of Line-Edge Roughness on FinFET Matching Performance.E. Baravelli, A. Dixit, R. Rooyackers, M. Jurczak, N. Speciale, K. De Meyer2007
- IEEE Trans. Electron Devices



All Years | 2009 | 2008 | 2007 | 2006 | Earlier


OwnBiblio 1.4 by P.A.Henning, C.Kolodziej, G.Langenbacher,B.Boss, J.Finn and P.Hübner


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