Publications: Process Variations

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All Years | 2009 | 2008 | 2007 | 2006 | Earlier


2008

There are 2 entries in this category.

Title - Conference/Journal/BookAuthorsDate
Impact of LER and Random Dopant Fluctuations on FinFET Matching Performance.E. Baravelli, M. Jurczak, N. Speciale, K. De Meyer, A. Dixit2008
- IEEE Trans. Nanotechnology

TCAD modeling and characterization of short-range variations in multiple-gate devices and circuit blocks.E. Baravelli, N. Speciale, A. Dixit, M. Jurczak2008
- Proc. MIXDES


All Years | 2009 | 2008 | 2007 | 2006 | Earlier


OwnBiblio 1.4 by P.A.Henning, C.Kolodziej, G.Langenbacher,B.Boss, J.Finn and P.Hübner


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