Publications: Process Variations

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2006

There are 1 entries in this category.

Title - Conference/Journal/BookAuthorsDate
Impact of Stochastic Mismatch on Measured SRAM Performance of FinFETs with Resist/Spacer-Defined Fins: Role of Line-Edge-Roughness.A. Dixit, K. G. Anil, E. Baravelli, P. Roussel, A. Mercha, C. Gustin, M. Bamal, E. Grossar, R. Rooyackers, E. Augendre, M. Jurczak, S. Biesemans, K. De Meyer2006
- IEDM Tech. Dig.



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OwnBiblio 1.4 by P.A.Henning, C.Kolodziej, G.Langenbacher,B.Boss, J.Finn and P.Hübner


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