Search results - 17 total found.
| Warped-Wigner-Hough Transformation of Lamb Waves for Automatic Defect Detection. | A. Perelli, L. De Marchi, E. Baravelli, A. Marzani, N. Speciale | 2011 |
| - Proceedings of IEEE IUS 2011 | |
| Multidimensional Complex Wavelet Transforms for Guided Waves directional filtering. | M. Nanni, L. De Marchi, E. Baravelli, N. Speciale | 2011 |
| - Proceedings of ICU 2011 | |
| Warped Frequency Transform for Damage Detection using Lamb Waves. | L. De Marchi, M. Ruzzene, B. Xu, E. Baravelli, A. Marzani, N. Speciale | 2010 |
| - SPIE Smart Structures/NDE | |
| LER-induced limitations to VDD scalability of FinFET-based SRAMs with different design options. | E. Baravelli, L. De Marchi, N. Speciale | 2009 |
| - Proc. ESSDERC |
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| Correlation of fin shape fluctuations to FinFET electrical variability and noise margins of 6-T SRAM. | E. Baravelli, L. De Marchi, M. Jurczak, N. Speciale | 2009 |
| - Proc. ULIS |
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| Fin-shape fluctuations in FinFET: Correlation to electrical variability and impact on 6-T SRAM noise margins. | E. Baravelli, L. De Marchi, N. Speciale | 2009 |
| - Solid-State Electronics | |
| Impact of LER and Random Dopant Fluctuations on FinFET Matching Performance. | E. Baravelli, M. Jurczak, N. Speciale, K. De Meyer, A. Dixit | 2008 |
| - IEEE Trans. Nanotechnology |
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| TCAD solutions for increasing dimensionality in solid-state device and process simulations. | L. De Marchi, E. Baravelli, N. Speciale | 2008 |
| - Progress in Solid State Electronics Research (NOVA Eds.) | |
| TCAD modeling and characterization of short-range variations in multiple-gate devices and circuit blocks. | E. Baravelli, N. Speciale, A. Dixit, M. Jurczak | 2008 |
| - Proc. MIXDES | |
| Impact of LER and Random Dopant Fluctuations on FinFET Matching Performance. | E. Baravelli, M. Jurczak, N. Speciale, K. De Meyer, A. Dixit | 2007 |
| - Silicon Nanoelectronics Workshop |
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| Impact of Line-Edge Roughness on FinFET Matching Performance. | E. Baravelli, A. Dixit, R. Rooyackers, M. Jurczak, N. Speciale, K. De Meyer | 2007 |
| - IEEE Trans. Electron Devices |
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| Wavelet Adaptivity for 3-D Device Simulation. | L. De Marchi, E. Baravelli, F.Franze', N. Speciale | 2007 |
| - IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems | |
| 3D mesh generation with wavelet-driven adaptivity. | L. De Marchi, E.Baravelli, F.Franze', N. Speciale | 2006 |
| - Int. Conf. on Simulation of Semiconductor Devices and Processes (SISPAD) | |
| Automatic wavelet Localization and Adaptive Meshing of Physical Relevances in Device Simulation. | E. Baravelli, L. De Marchi, F. Franze', N. Speciale | 2006 |
| - IEEE PhD Research in Microelectronics and Electronics (PRIME) | |
| Impact of Stochastic Mismatch on Measured SRAM Performance of FinFETs with Resist/Spacer-Defined Fins: Role of Line-Edge-Roughness. | A. Dixit, K. G. Anil, E. Baravelli, P. Roussel, A. Mercha, C. Gustin, M. Bamal, E. Grossar, R. Rooyackers, E. Augendre, M. Jurczak, S. Biesemans, K. De Meyer | 2006 |
| - IEDM Tech. Dig. |
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| Wavelet-Based Adaptive Mesh Generation for Device Simulation. | L.De Marchi, F.Franze', E.Baravelli, N.Speciale | 2006 |
| - Solid-State Electronics | |
| Wavelet-Based Adaptive Mesh Generation for Device Simulation. | L.De Marchi, F.Franze', E.Baravelli, N.Speciale | 2005 |
| - Proc. ESSDERC | |
